Professor Lanza is recognized as a leading scholar on the study of hexagonal boron nitride(h-BN) and other ultra-thin dielectrics for electronic devices (SiO2, HfO2, Al2O3). Hisresearch aims to enhance the performance of silicon microchips and integrated circuitsusing 2D materials with outstanding electronic, thermal, chemical, physical and opticalproperties, with special emphasis placed on memristive crossbar arrays and their use inbuilding artificial neural networks. To facilitate his research, he utilizes nanoelectroniccharacterization of multiple materials and devices using scanning probe microscopy (SPM). ​